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Product features
1.3 Mpx
Dino-Lite Long Working Distance
10-140x
USB 2.0
Yes
8
30 fps
No
Yes
Yes
Flexible LED Control (FLC), Automatic Magnification Reading (AMR), EDOF/EDR &
Depth information
Depth information
The Dino-Lite AM4917MZTL belongs to the premium EDGE PLUS series and the LWD (Long Working Distance) category, which allows comfortable working with a longer distance between the lens and the sample. It offers 10-140× magnification, 1.3 MP resolution and USB 2.0 connectivity with smooth image transfer up to 30 frames per second.
The microscope provides excellent image quality, sharp details and true color reproduction. The rugged metal body ensures high durability even under heavy-duty use.
A unique feature of this model is depth analysis, which allows the user to obtain spatial information by indicating changes in focus. This is particularly useful when measuring or checking the depth of grooves, holes or other topographic structures.
The EDOF (Extended Depth of Field) function allows a series of images to be automatically captured at different focus levels and combined into one sharp image, ideal when observing uneven or textured surfaces.
EDR (Extended Dynamic Range) automatically captures images at different exposures and combines them into a single image with a higher dynamic range, allowing you to better capture details in both dark and bright areas.
The AMR (Automatic Magnification Reading) function detects the current magnification level of the microscope and displays it directly in the Dino-Lite software. This information is also stored with the captured image, greatly simplifying the measurement and documentation process.
The built-in polarizing filter makes this model ideal for observing shiny or reflective materials such as metals, plastics, glass, jewelry, electronic components and more.
The microscope provides excellent image quality, sharp details and true color reproduction. The rugged metal body ensures high durability even under heavy-duty use.
A unique feature of this model is depth analysis, which allows the user to obtain spatial information by indicating changes in focus. This is particularly useful when measuring or checking the depth of grooves, holes or other topographic structures.
The EDOF (Extended Depth of Field) function allows a series of images to be automatically captured at different focus levels and combined into one sharp image, ideal when observing uneven or textured surfaces.
EDR (Extended Dynamic Range) automatically captures images at different exposures and combines them into a single image with a higher dynamic range, allowing you to better capture details in both dark and bright areas.
The AMR (Automatic Magnification Reading) function detects the current magnification level of the microscope and displays it directly in the Dino-Lite software. This information is also stored with the captured image, greatly simplifying the measurement and documentation process.
The built-in polarizing filter makes this model ideal for observing shiny or reflective materials such as metals, plastics, glass, jewelry, electronic components and more.